Probe for DC-EFM/PFM
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
| Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 |
|
|---|---|---|---|
| NSC36/Cr-Au (10ea.) | |||
| 610-1002 | ▪ Probe for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
| 610-0002 | Unmounted Type | 346,000 | |
| NSC14/Cr-Au (10ea.) | |||
| 610-1013 | ▪ Probe for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 474,000 |
| 610-0013 | Unmounted Type | 345,000 | |
| PPP-NCSTAu (10ea.) | |||
| 610-1009 | ▪ Probe for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Au ▪ Typical tip length: 10 - 15 μm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 681,000 |
| 610-0009 |
Unmounted Type | 551,000 | |
| ElectriMulti75-G (10ea.) | |||
| 610-1098 | ▪ Probe for electrical modes (EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 474,000 |
| 610-0098 |
Unmounted Type | 345,000 | |
| PPP-EFM (10ea.) | |||
| 610-1101 | ▪ Probe for EFM/KPFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 772,000 |
| 610-0101 |
Unmounted Type | 642,000 | |
| PPP-CONTSCPt (10ea.) | |||
| 610-1073 | ▪ Probe for DC-EFM/PFM/CP-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz |
Mounted Type | 772,000 |
| 610-0073 |
Unmounted Type | 642,000 | |
| NSC36/Pt (10ea.) | |||
| 610-1161 | ▪ Probe for DC-EFM/PFM ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <30 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 474,000 |
| 610-0161 | Unmounted Type | 345,000 | |
| PtSi-FM (10ea.) | |||
| 610-1039 | ▪ Probe for EFM/KPFM ▪ Platinum silicide coating on both sides of the cantilever ▪ Typical tip length: ~ 12.5 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 2,308,000 |
| 610-0039 | Unmounted Type | 2,114,000 |
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