-
Pores HDD Floppy Water Topography ScanningThermalMicroscopy NiFe C36H74 LaAlO3 layers bias_mode KPFM MetalCompound Polypropylene Polytetrafluoroethylene ForceMapping Sadowski single_layer WPlug Cobalt cross section mechanical_property INSPParis GaP Pyroelectric Magnetic Phenanthrene #Materials Film semifluorinated_alkanes Conductive AFM DOE Device VinylAlcohol LateralPFM
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Atomic steps on GaP(Gallium Phosphide) layer on Si
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: PPP-NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512