In this webinar the principle of electrostatic force microscopy (EFM) will be discussed to map electrical properties of the sample by sensing the electrostatic force between the tip and the sample. The images obtained from EFM or rather Kelvin probe force microscopy (KPFM) reveal the surface potential or distribution of surface charges of the sample surface at nanometer scale as well as map the work functions of the materials along with the topographical information. The electrostatic force gives the information of the electrical signals and the van der Waals forces give the topography of the sample surface. We shall discuss the two main approaches to decouple the electrostatic and van der Waals forces viz. the lift mode and dual frequency EFM along with the instrumentation setup using Park System AFM.
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
Copyright © 2024 Park Systems. All Rights Reserved.