开尔文探针力显微镜 (KPFM) 是一种静电力显微镜 (EFM) 技术,被广泛应用于研究各种导电或半导体样品表面电特性。KPFM 提供局部表面电位分布的定量结果,或者,校准后,测量样品的功函数。KPFM 广泛用于研究和工业中,用于对各种应用(如聚合物化合物或太阳能电池等电子设备)的功函数变化进行成像。 在本次网络研讨会中,我们将展示开尔文探针力显微镜 (KPFM) 在 Park FX40全自动化原子力显微镜上的原理和应用。
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
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