There are lots of techniques for characterizing the mechanical properties of sample, atomic force microscopy (AFM) has been widely used to investigate sample’s properties because it is able to measure Young’s modulus directly and quantitative measurement using force spectroscopy with contact mechanics models. From interactions between the AFM tip and the sample surface, the system collects that information and displays the output using force and distance units. In this presentation, we reviewed Park Systems’s mechanical properties measurement using AFM, with a particular emphasis on the “PinPoint nanomechanical mode”. This mode gathers topographical data at high resolution while simultaneously obtaining force-distance (FD) data at each pixel of the scan area. This allows sample surface morphology measurements while simultaneously obtaining quantitative nanomechanical properties such as modulus, adhesion, deformation, stiffness and energy dissipation.

Presented By : 
Dr. Jake Kim, Park Systems Korea

Dr. Kim received Ph.D. degree in Materials Science and Engineering from Nanyang Technological University, Singapore. He joined Tokyo Institute of Technology International Research Opportunities Program (TiROP) in 2014 and was engaged in nano-scale chemical composition analysis using scanning probe microscopy (SPM). From December 2017, he started to work in Park Systems as the manager of application technology center. He is specialized in the enhancement of nano-machanical measurement performance for Atomic Force Microscopy (AFM), building up a accurate and reliable environment for electrochemical measurement using Scanning Probe Microscopy (SPM; SECM,SECCM) and Scanning Ion Conductance Microscopy (SICM) applications development for biology.