2022년 7월 22일 하이브리드로 개최되는 FAMT 2022 심포지엄은 관련 분야 전문가들을 위한 기술연구 교류의 장이 될 것입니다.
혁신적인 나노기술과 물리적인 고장분석(FA)을 위한 방법을 논의하고 연구동향을 파악할 수 있는 좋은 기회가 될 FAMT 2022에 지금 바로 등록하세요!
ON-SITE VENUE: Fraunhofer IISB, Schottkystrasse 10, Erlangen, Germany
VIRTUAL PLATFORM: Zoom
The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.
Join us as an expert and present your application study
Submit your ABSTRACT here: 초록 제출
Deadline: June 15, 2022
Join as listener and network with the semi-commnunity
SESSIONS
○ Emerging applications in the electronic industry
○ case studies from the semiconductor device applications
○ Innovative methods and tools for characterization of the material and defect review
○ Future methods for increasing line productivity, efficiency, and yield
Access to the event is free of charge.
Contact:
Anastasiia Kaminska atom@parksystems.com
Mathias Rommel Mathias.Rommel@iisb.fraunhofer.de