Various macroscopic properties of polymers are strongly influenced by packing and conformation of individual macromolecules as well as their monomer composition. Therefore, being able to resolve individual polymer chains in real space is crucial in understanding the overall structure of polymers.
Join our webinar series from October 2020 to February 2021 on investigation of polymer structures at the nanoscale!
Wednesday, 28 October 2020
Joint webinar with Nano Nature
Nano Webinar: “Nano: High Resolution AFM Imaging for Polymer Science”
In this webinar, guest presenter Dr. Vladimir Korolkov (Senior Application Scientist at Park Systems UK) will demonstrate how to better understand the overall structure of polymers. You will learn to resolve individual polymer chains in real space, and witness how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape. In the second part of this webinar, you'll be given a comprehensive demonstration of the Nano platform by the expert Product Manager at Nano Nature, Dr Pranoti Kshirsagar.
Watch here.
Thursday, 28 January 2021
Nailing down Teflon Molecules - High Resolution AFM imaging for Polymer Science
Presenter: Dr. Vladimir Korolkov, Senior Application Scientist at Park Systems UK
In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape. Both high resolution and high-speed scanning capabilities of Park Systems NX20 AFM will be demonstrated on the real-world polymer sample.
Join here.
Thursday, 11 February 2021
PinPointing Polymers: Nanomechanical Characterization of Functional Polymer Blends
Presenter: Abdul Rauf, Application Scientist at Park Systems Europe
In this webinar, we will describe and demonstrate polymer characterization using PinPointTM mapping on Park System’s NX10 atomic force microscope. Additionally, we will demonstrate example measurements where electrical property maps are acquired simultaneously with topography and nanomechanical maps.
Join here.