Friday, June 12, 2020
- 3:00 pm
(EDT)
Boston, New York - 12:00 pm
(PDT)
San Francisco, LA - 8:00 pm
(GMT)
London - 9:00 pm
(CET)
Paris, Rome
Polystyrene - Low density polyolefin elastomer sample (PS-LDPE).
Modulus image obtained by Pinpoint Mode shows the difference in modulus (MPa to GPa) of the different materials in the PS-LDPE sample
PinPoint™ is an advance imaging mode developed by Park Systems, that acquires high-resolution topography and F/D data at each pixel of the entire scan area. With PinPoint™ mode, quantitative nanomechanical properties (i.e., modulus, adhesion, topography) can be obtained all at once. This session will demonstrate how to acquire nanomechanical properties using Park Systems PinPoint™ Mode. Park NX10 hardware and software will be used to explain basic principle, calibration and data analysis.
Presented By :
Armando Melgarejo, Park Systems Technical Support Engineer
Armando Melgarejo is an engineer for Park Systems, where he focuses on the installation and support of AFM systems for Park’s research user base. He holds a B.S. in Biotechnology Engineering from Autonomous University of Queretaro, Mexico. During his studies, he also spent a semester doing research in nanotechnology and molecular biology at Czech Technical University in Prague, Czech Republic. Other areas of expertise include diverse characterization techniques (AFM, SEM, RAMAN and IR), genetics and molecular and cell biology.