The tip of an atomic force microscope (AFM) is at the heart of the instrument as it interacts with the sample surface and hence proper probe selection is critical for obtaining high-quality surface images. The actual shape of the tip used in AFM is an important consideration, and choice of tip shape is closely linked to mapping the properties of the sample studied. An AFM probe is made up of a silicon chip, a cantilever, and a tip at the end of the cantilever. AFM probes are available in a variety of materials, shapes (geometry), stiffnesses (spring constants), resonance frequencies, and Q-factors. Generally, we can use non-contact or contact mode cantilever depending on its properties. The sample material and applications dictate the probe selection. This webinar will give a glimpse of the AFM tips world and will guide you to select appropriate tips for your specific applications on AFM.
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
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