-
Etch HiVacuum InorganicCompound Conducting Polyimide Semiconductor Solution IISCBangalore dichalcogenide Heat TemperatureControllerStage Mobile Hexylthiophene cannabidiol FrictionForce polymeric_arrays Magnets ConductingPolymer Hexacontane BismuthVanadate NtuEee Pvdf molecule Bmp 2dMaterials semifluorinated alkane Titanate ImideMonomer Phthalocyanine FM-KPFM GaN PhthalocyaninePraseodymium rubber Iron PolymerBlend
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126