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Tin disulfide Graphene Dimethicone fluoroalkane OpticalModulator PVAP3HT ForceDistanceSpectroscopy Fujian PpLdpe Genetic Current VerticalPFM Pattern atomic_layer Vanadate LithiumNiobate ContactMode SiliconeOxide NCM MolecularSelfAssembly ULCA Polydimethylsiloxane PolycrystallineFerroelectricBCZT LiftMode Chungnam_National_University Austenite CHRYSALIS_INC Mobile Multiferroic_materials Fet Phenanthrene BaTiO3 Sapphire Sic CuSubstrate
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256