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Atomic force microscopy (AFM) and its associated functional modes such as Kelvin probe force microscopy (KPFM) detect forces on the scale of 1 nN in-order-to measure the topography and functional properties of surfaces with nanometre scale resolution.

 
 
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Exploring ferroelectricity in layered materials using atomic force microscopy in vacuum

 

Wednesday, 18 May 2022

  • 10:00 am – 11:00 am
    (GMT)
    London, Dublin
  • 11:00 am – 12:00 pm
    (CET)
    Berlin, Paris, Rome
  • 19:00 pm – 20:00 pm
    (UTC+9)
    Seoul, Tokyo
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The Park systems NX-Hivac has been (a) may be used to perform electrostatic force microscopy (EFM) measurements on parallel stacked hBN, which exhibits a ferroelectric superlattice (b). The EFM phase images enables the morphology of the ferroelectric domains which are formed mechanically to be mapped spatially with nanometre scale resolution (c).

Check out all webinars from the Trends vs. Hypes in AFM series here.

Atomic force microscopy (AFM) and its associated functional modes such as Kelvin probe force microscopy (KPFM) detect forces on the scale of 1 nN in-order-to measure the topography and functional properties of surfaces with nanometre scale resolution. Under ambient conditions however, damping of the cantilever and interactions with airborne contaminants adsorbed at interfaces degrade the sensitivity of AFM measurements. By utilising the Park NX-Hivac, a system which enables the performance of AFM measurements down to the 1x10-6 mbar range, we demonstrate performance in topography and electrostatic modes which are closer to the intrinsic limit of scanning probe microscopy systems in a platform free from the laborious operating procedures and practical limitations of full ultra-high vacuum-based AFM.

In this webinar, we expand on our recent webinar using the Park Systems FX40 automatic AFM [1] to explore a system which has received significant recent attention from the layered materials research community; ferroelectric superlattices formed by the formation of parallel stacked interfaces [2-4]. Taking such a parallel stacked boron nitride interface on graphene, we first observe ferroelectric domains using both electrostatic force microscopy (EFM) and KPFM with improved sensitivity versus measurements performed under ambient conditions. We then go on to demonstrate the observation of features in topography height and phase channels which further exemplify the opportunities to study tip-sample interactions in much richer detail in vacuum.

[1] ‘ https://parksystems.com/medias/nano-academy/webinars/115-webinars/2415-enriching-your-afm-data-kpfm-high-resolution-imaging-of-ferroelectric-domains-with-automated-afm
[2] C. R. Woods et al. Nat Commun. 12, 347 (2021).
[3] M. Vizner Stern et al. Science 372, 1462-1466 (2021)
[4] K. Yasuda et al. Science 372, 1458-1462 (2021)

james

Presenter: 
James Kerfoot, Application Scientist at Park Systems United Kingdom

James received his PhD in Physics from the University of Nottingham in 2018, studying the morphology and optical properties of monolayers of self-assembled molecules and their heterostructures. He then went on to work as a postdoctoral researcher, also at the University of Nottingham, working on the formation of hybrid heterostructures of molecular assemblies and layered materials demonstrating both electroluminescence and selective triplet excitation. In 2020, James took up a position as a postdoctoral researcher at the Cambridge Graphene Centre, using scanning probe microscopy and optical spectroscopy to study electrostatics and optical properties of layered materials heterostructures with controlled twist angle and their scalable incorporation into integrated photonic circuits. Since January 2022, James has been a member of the Park Systems team as an applications scientist, supporting customers with interest ranging from fundamental physics to industrial scale production in the application of a diverse range of scanning probe microscopy techniques to gain insightful results.

 

 

 

Park Lectures - Park Atomic Force Microscope