The coupling between an electrical and mechanical response in a material is a fundamental property that provides functionality to a variety of applications ranging from sensors and actuators to energy...

Magnetization reversal plays a major role in designing the switching mechanisms of magnetic nanostructures in a high density storage device. In this study, magnetization reversal in a magnetic pattern...

Undercut Structures and Sidewall Roughness XE-3DM The XE-3DM metrology AFM incorporates the decoupled scanner configuration.   Because the Z scanner is independent of the XY scanner, ...

AFM Metrology Considerations of Hard Disk Manufacturing Why Atomic Force Microscope? As the design rule becomes smaller, traditional metrology tools, such as stylus and optical profilers, and CD-S...

Programmable Data Density (PDD) for High Throughput Feature Measurement Park Systems, the Nanotechnology Solutions Partner for HDD Industry Park Systems serves the hard disk d...

Automatic Defect Review AFM for Hard Disk Media and Substrates Park Systems, Nanotechnology Solutions Partner for HDD Industry Park Systems serves the hard disk drive (HDD) in...

Patterned Arrays of Magnetic Nanostructures Patterned arrays of magnetic nanostructures have become one of the key issues in recent years because of its potential application to information tech...

Surface Roughness Measurement of Media and Substrate Surface Roughness Measurement of Media and Substrate Eunji Shin (Industrial Product Management of Park Systems, Seoul, Korea)   Atomic ...

Critical Roughness Metrology Figure 1. Non-Contact mode topography image of a stainless steel wafer measured using an XE-150.  Automated step and scan measurements on the wafer revea...

Single Crystal Yttrium Iron Garnet (YIG) Magnetic Properties - (Tunable Magnetic Field MFM) Tunable Magnetic Field MFM (TM-MFM) can be used for high resolution magnetic domain studies under...