The tip of an atomic force microscope (AFM) is at the heart of the instrument as it interacts with the sample surface and hence proper probe selection is critical for obtaining high-quality surface images. The actual shape of the tip used in AFM is an important consideration, and choice of tip shape is closely linked to mapping the properties of the sample studied. An AFM probe is made up of a silicon chip, a cantilever, and a tip at the end of the cantilever. AFM probes are available in a variety of materials, shapes (geometry), stiffnesses (spring constants), resonance frequencies, and Q-factors. Generally, we can use non-contact or contact mode cantilever depending on its properties. The sample material and applications dictate the probe selection. This webinar will give a glimpse of the AFM tips world and will guide you to select appropriate tips for your specific applications on AFM.