How to choose an AFM probe
Probe Store - Conductive AFM / VECA / ULCA
For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.
| Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote | ||||||||||||||||||||||||
| CDT-CONTR | 0.5 | 20 | Nanosensors | ▪ Contact cantilever for conductive AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
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| PPP-CONTSCPT | 0.2 | 25 | Nanosensors | ▪ Cantilever for DC-EFM/PFM/C-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
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| AD-2.8-AS | 2.8 | 65 |  |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type on teflon-coated chip carrier |
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| AD-40-AS | 40 | 180 | |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type on teflon-coated chip carrier |
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| AD-2.8-SS | 2.8 | 65 | |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ Mounted type on teflon-coated chip carrier |
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| AD-40-SS | 40 | 180 | |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single cyrstal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ▪ Mounted type on teflon-coated chip carrier |
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| 25Pt300B | 18 | 20 | Rocky Mountain Nanotechnology | ▪ Contact cantilever for conductive AFM(C-AFM)/SCM ▪ Solid platinum tip ▪ Recommended for high voltage/current application above ±10 V or 1 µA ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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| NSC18/Cr-Au | 2.8 | 75 | Mikromasch | ▪ Contact cantilever for conductive AFM(C-AFM) ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Mounted type on Conductive AFM (C-AFM) Chip Carrier |
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