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    AFM Specifications

Park NX12 Specifications


Z Scanner

AFM Head
Flexure guided high-force scanner
Scan range: 15 µm (optional 30 µm)

Flexure-guided structure driven by
multiply-stacked piezoelectric stacks
Scan range: 15 µm (optional 30 µm)

XY Scanner

Flexure guided XY scanner with closed-loop control
Scan range: 100 x 100 µm



XY stage travel range: 10 mm x 10 mm (Motorized)
Z stage travel range: 25 mm (Motorized)
Focus stage travel range: 15 mm (Motorized)


Sample Mount

Sample size : Open space up to 50 mm x 50 mm, thickness up to 20 mm (Sample size less than 40 mm x 40 mm recommended using SPM modes)


On-Axis Optics

10x (0.21 NA) ultra-long working distance lens (1 µm resolution)
Direct on-axis vision of sample surface and cantilever
Field-of-view : 840 × 630 µm (with 10× objective lens)
CCD : 5 M Pixel, 1.2 M Pixel (optional)


Inverted Optical Microscopy

Fluorescence microscopy (optional)
Confocal microscopy (optional)




• AFM system control and data acquisition software
• Auto mode for quick setup and easy imaging
• Manual mode for advanced use and finer scan control


• AFM data analysis software
• Stand-alone design—can install and analyze data away from AFM
• Capable of producing 3D renders of acquired data



Integrated functions

4 channels of flexible digital lock-in amplifier
Spring constant calibration (Thermal method)
Digital Q control


Dielectric/Piezoelectric Properties

Electric Force Microscopy (EFM)
Piezoresponse Force Microscopy (PFM)
PFM with High Voltage*
Contact Resonance PFM (CR-PFM)*

Mechanical Properties

Force Modulation Microscopy (FMM)
Nanolithography with High Voltage*



• Liquid Probehand
• Universal Liquid Cell with Temperature Control
• Live Cell Chamber
• Temperature Controlled Stage 1, 2 and 3
• Electrochemistry Cell
• GloveBox
• High-field Magnetic Field Generator
• Tilting Sample Chuck
• Snap-in Sample Chuck