Park NX12 Specifications
Scanner
Z Scanner
AFM Head
Flexure guided high-force scanner
Scan range: 15 µm (optional 30 µm)
SICM Head
Flexure-guided structure driven by
multiply-stacked piezoelectric stacks
Scan range: 15 µm (optional 30 µm)
XY Scanner
Flexure guided XY scanner with closed-loop control
Scan range: 100 x 100 µm
Stage
XY stage travel range: 10 mm x 10 mm (Motorized)
Z stage travel range: 25 mm (Motorized)
Focus stage travel range: 15 mm (Motorized)
Sample Mount
Sample size : Open space up to 50 mm x 50 mm, thickness up to 20 mm (Sample size less than 40 mm x 40 mm recommended using SPM modes)
On-Axis Optics
10x (0.21 NA) ultra-long working distance lens (1 µm resolution)
Direct on-axis vision of sample surface and cantilever
Field-of-view : 840 × 630 µm (with 10× objective lens)
CCD : 5 M Pixel, 1.2 M Pixel (optional)
Inverted Optical Microscopy
Fluorescence microscopy (optional)
Confocal microscopy (optional)
Software
SmartScan™
• AFM system control and data acquisition software
• Auto mode for quick setup and easy imaging
• Manual mode for advanced use and finer scan control
SmartAnalysis™
• AFM data analysis software
• Stand-alone design—can install and analyze data away from AFM
• Capable of producing 3D renders of acquired data
Electronics
Integrated functions
4 channels of flexible digital lock-in amplifier
Spring constant calibration (Thermal method)
Digital Q control
Options/Modes
Standard Imaging
True Non-Contact
Contact
Tapping
PinPoint™ AFM
Lateral Force Microscopy (LFM)
Phase Imaging
Scanning Ion Conductance Microscopy (SICM)
Force Measurement
Dielectric/Piezoelectric Properties
Electric Force Microscopy (EFM)
Piezoresponse Force Microscopy (PFM)
PFM with High Voltage*
Contact Resonance PFM (CR-PFM)*
Mechanical Properties
Force Modulation Microscopy (FMM)
Nanoindentation
Nanolithography*
Nanolithography with High Voltage*
Nanomanipulation*
Magnetic Properties
Thermal Properties*
Chemical Properties*
Chemical Force Microscopy with Functionalized Tip
Electrochemical Microscopy (EC-AFM)
Scanning Ion Conductance Microscopy (SICM)
Scanning Electrochemical Cell Microscopy Single Barrel (SECCM Single Barrel)
Scanning Ion Conductance Microscopy-Scanning Electrochemical Microscopy (SICM-SECM)
Accessories*
• Liquid Probehand
• Universal Liquid Cell with Temperature Control
• Live Cell Chamber
• Temperature Controlled Stage 1, 2 and 3
• Electrochemistry Cell
• GloveBox
• High-field Magnetic Field Generator
• Tilting Sample Chuck
• Snap-in Sample Chuck
Options
A wide range of environment control options including versatile electrochemistry cells, temperature stage, and glovebox with humidity control.
Electrochemistry cells
• Electrochemistry cell
• Electrochemistry toolkit for universal liquid cell
Electrochemistry options
• Potentiostat
• Bipotentiostat
Environmental Control Options
• Glovebox
• Live cell chamber
Temperature Controlled Stages
• Temperature controlled stage (-25 ~170 ºC)
Z Scanner Heads
• 15 μm Z Scanner AFM head
• 30 μm Z Scanner AFM head
• 15 μm Z Scanner SICM module
• 30 μm Z Scanner SICM
module
In-Liquid Imaging Options
• Liquid probe hand
• Open liquid cell
• Universal liquid cell
Acoustic Enclosure
• Stand alone type AE 204
Clip-type Chip Carrier
• Can be used with unmounted cantilever
• Tip bias function available for conductive AFM and EFM
• Tip bias
range: -10 V ~ 10 V
Starter kits for advanced modes
• Easy to use for advanced modes
• Includes specialized probes and samples
Park NX12
A versatile microscopy platform for analytical chemistry researchers and shared user facilities
- Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
- Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
- Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration
Proven Park NX10 performance Equipped with Inverted Optical Microscopy
Park NX12 couples the versatility and accuracy of Park’s AFM with a sample stage for inverted optical microscopy. This enables the study of electrochemical properties in samples that are transparent, opaque, soft or hard.
The perfect platform for fundamental electrochemistry
The study of the electrochemistry of batteries, fuel cells, sensors, and corrosion is a rapidly growing field, yet many AFMs do not directly address their unique needs. Park NX12 offers the functionality and flexibility chemistry researchers require by giving them one simple, easy-to-use platform with all the tools they need, including:
- Versatile and easy-to-use electrochemistry cells
- Environmental control options for inert gas and humidity
- Inverted optical microscope (IOM)
- Bi-potentiostat compatibility
Researchers can utilize the Park NX12 platform for various electrochemical applications:
- Scanning Electrochemical Microscopy (SECM)
- Scanning Electrochemical Cell Microscopy (SECCM)
- Electrochemical Atomic Force Microscopy (EC-AFM)
Easy optical access with motorized focus stage
- The system allows for top, side, and bottom optical access to the probe from various angles during measurements. This broad optical access combined with the device’s modular design also allows for optical or nano-optical add-ons.
Technical Info
Built with multi-user facilities in mind
Park NX12 was built from the ground up to accommodate the needs of multi-user facilities. Other AFM solutions lack the required versatility to address the diverse needs of users in these facilities, making it difficult to justify the equipment cost. The Park NX12, however, is built to accommodate standard ambient AFM, in-liquid SPM and optical imaging, making it one of the most flexible AFMs available.
A modular platform for shared user facilities
The Park NX12 is an Atomic Force Microscopy platform specifically tailored to address the needs of analytical and electrochemistry researchers as well as those working in shared use facilities.
It provides a versatile solution for SPM based characterization of chemical and electrochemical properties and surface characterization in both air and liquid media for a broad range of opaque and transparent materials.
The Park NX12 is easy to use for pipette based SPM techniques with broad visual optical access to the scanning probe.
The Park NX12’s reasonable price and unparalleled accuracy makes it the ideal platform for multi-user facilities as well as early career researchers.
Multiple Applications
The Park NX12 can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.
Comprehensive force spectroscopy solution
The Park NX12 provides a complete package for nanomechanical characterization in-liquid and in-air, making it ideal for a wide range of applications.
Modular
We make it easy to modify the Park NX12 to suit the unique needs of your lab by installing optional hardware and software add-ons even after installation.
Current-Distance(I-D) Spectroscopy
Acquiring Current-Distance Curve of SICM on the way of pipette approach (vertical direction movement) toward sample surface is beneficial to elucidate various biological and chemical phenomena in aqueous environment.
This beneficial application can be applied to a specific and interesting object of sample, identified with SICM’s non-invasive topography. Furthermore, utilizing the ‘current-distance curve mapping’ function enables researcher to examine and acquire the current-distance curve at multiple to reach a deeper level understanding for biological and chemical reaction research.
Park SmartScan™ makes scanning fast and simple
The Park NX12 is equipped with our SmartScan™ OS, making it one of the easiest to use AFMs in the market. With an intuitive but extremely powerful interface, even untrained users can quickly scan a sample without supervision. This lets senior researchers focus their experience on solving bigger problems and developing better solutions.
Easy-to-use
Shared labs often have users from a wide range of backgrounds and experience levels. The NX12 can accommodate every user with its simple point and click interface and automated SmartScan™ mode.
Here is how it works after you turn on the AFM system
