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GaN dielectric_trench Sic Inorganic SiWafer FAFailureAnlaysis CNT ito_film SFAs Worcester_Polytechnic_Institute Display Co/Cr/Pt Hexacontane Wang ElectroChemical LiftMode 3-hexylthiophene STO LiIonBattery Mechanical&nanotechnology fluoroaalkane Gold BCZT Annealed molecule plastic HardDiskMedia BiasMode 2-vinylpyridine Singapore Cell MoS2 Vortex PhaseTransition bias_mode
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Domain switching on PZT
Scanning Conditions
- System: NX10
- Scan Mode: Lithography, PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black +10V, White -10V