Global
Report image

If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.

Please enter your name
Please enter your comment

Christmas ball lithography on Si substrate

Christmas ball lithography on Si substrate 2

Scanning Conditions

- System: NX10
- Scan Mode: Contact, lithography
- Cantilever: : ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 30μm×30μm
- Scan Rate: 0.5Hz
- Pixel: 512×512

AFM Image Gallery