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Technical Articles

24, Dec 13'
Category: Data Storage
Critical Roughness Metrology Figure 1. Non-Contact mode topography image of a stainless steel wafer measured using an XE-150.  Autom...
23, Dec 13'
Category: Materials
True Sample Topography Acquired by Low-Noise Z Position Sensor Ahram Kim (Research Product Management of Park Systems, Seoul, Korea)   Pi...
24, Dec 13'
Category: Solar Cell
Solar Cells Optical Property - Photoconductivity   Topography (left image) and photocurrent (right images) with laser sou...
23, Dec 13'
Category: Nano Materials
SrTiO3 Surfaces by Using Park Systems AFM SrTiO3 Surfaces by Using Park Systems Atomic Force Microscope John G. Connell and S. S. Ambrose...
24, Dec 13'
Category: Nano Fabrication
High Aspect Ratio Structure High Aspect Ratio Structure – Deep Trench Nanometrology Figure 1 shows a 50nm wide silicon trench, with aspect ...
23, Dec 13'
Category: Photonics
Nanoscale Surface Photovoltage Spectroscopy Investigation of Nanostructures Utilizing the Park AFM Instruments Case Study: Zinc Oxide Nanostruc...
24, Dec 13'
Category: Semiconductor
Critical Dimension Measurement of High Aspect Ratio Trench with Park AFM AFM and the Semiconductor Industry Atomic Force Microscopy (AFM) is em...
23, Dec 13'
Category: Polymer
Cross-section of Polymer Film Imaging a Narrow Area Using a Park AFM Instrument Case study: Cross-section of a Polymer Film  By H.-Y. N...
24, Dec 13'
Category: Semiconductor
Chemical Mechanical Polishing (CMP) Metrology with Advanced AFM Surface Profiler Chemical Mechanical Polishing Figure 1. The key matrices o...
23, Dec 13'
Category: Nano Materials
Zinc Oxide Surfaces Nanoscale AFM and KPFM Mapping of Localized Charge and Recombination Centers on Chemically Active ZnO Surfaces Case Study: ...

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