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Technical Articles

26, Dec 13'
Category: Data Storage
Automatic Defect Review AFM for Hard Disk Media and Substrates Park Systems, Nanotechnology Solutions Partner for HDD Industry ...
24, Dec 13'
Category: MEMS structure
New 3-Dimensional AFM for CD Measurement and Sidewall Characterization Yueming Hua*, Cynthia Buenviaje-CogginsPark Systems Inc. 3040 Olcott St. ...
26, Dec 13'
Category: Data Storage
Patterned Arrays of Magnetic Nanostructures Patterned arrays of magnetic nanostructures have become one of the key issues in recent years becaus...
24, Dec 13'
Category: Semiconductor
New 3D-AFM for High Resolution Sidewall Imaging Limitations of Conventional 3D AFM   Flare Tip&nb...
26, Dec 13'
Category: Data Storage
Surface Roughness Measurement of Media and Substrate Surface Roughness Measurement of Media and Substrate Eunji Shin (Industrial Product Managemen...
24, Dec 13'
Category: Semiconductor
Etched Silicon Structures Metrology – Non-Contact Mode With the increasing shrinkage of device sizes, the characterization of thin films and ...
24, Dec 13'
Category: Semiconductor
High Throughput and Non-Destructive Sidewall Roughness Measurement Using 3-Dimensional AFM High Throughput and Non-Destructive Sidewall Roughness M...
24, Dec 13'
Category: Data Storage
Critical Roughness Metrology Figure 1. Non-Contact mode topography image of a stainless steel wafer measured using an XE-150.  Autom...
24, Dec 13'
Category: Nano Materials
True Sample Topography Acquired by Low-Noise Z Position Sensor True Sample Topography Acquired by Low-Noise Z Position Sensor Ahram Kim (Research ...
24, Dec 13'
Category: Solar Cell
Solar Cells Optical Property - Photoconductivity   Topography (left image) and photocurrent (right images) with laser sou...

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