OVERVIEW
Park Systems and University of Bologna are proud to announce the 2nd NanoScientific Forum Europe 2019 (NSFE 2019) on September 11 – 13, 2019.
After the successful first edition in October 2018 at the TU Freiberg, Germany we are happy to invite scientists and researchers working in the field of Atomic Force Microscopy to beautiful Bologna. The NSFE 2019 will be hosted by Tobias Cramer, Department of Physics and Astronomy of University of Bologna (UNIBO), and co-organized by CNR-ISMN Bologna, Italy.
An exciting agenda is planned for the 2.5 days:
- • Lectures by renowned AFM researchers
- • Instrument workshops on Park Systems AFMs, including basic and advanced measuring techniques as well as tips and tricks, how to obtain stunning AFM data
- • Poster session and image contest with amazing prizes!
- • Evening Program:
Wednesday Evening: Science meets Jazz - Conference Dinner
Thursday Evening: Enjoy Eataly - Bologna Tour & Wine/Aperitivo Tasting
This open AFM User Forum focuses on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM). With the NanoScinetific Concept - the idea behind the series of annual NSFE meetings - we are committed to:
- • Bringing together science and the technology behind it,
- • Bringing together AFM applications and methodology,
- • Creating a platform for AFM users around Europe.
NSFE is hosted every year at a different prestigious scientific venue, under the patronage of Park Systems and NanoScientific Magazine
KEYNOTE SPEAKERS
Instituto de Ciencia de Materiales de Madrid, CSIC, Spain
- A force microscope exploration of water, ions, proteins and cells
University of Bologna, Italy
- Organic Bioelectronic Interfaces investigated by Multimodal Scanning Probe Microscopies
Max Planck Institute for Polymer Research, Germany
- Interfaces in Perovskite Solar Cells
University Dresden, Germany
to come
MLU - Centre for Innovation Competence SiLi-nano, Germany
- Characterizing photoelectric and ferroelectric properties of materials with scanning probe microscope
CSIC • Institut de Ciència de Materials de Barcelona, Spain
- Detailed Insights into the Function and Structure of Organic Semiconductors at the nanoscale
CIC, University of Granada, Spain
- Metallo-DNA molecules as a tool for nanoscience and nanotechnology
Institute of Nuclear Physics, Poland
- AFM Applications in biology and medicine
Trinity College Dublin, Ireland
- Electrochemical measurements of single nanoparticles
VP of Park Systems and Director of R&D Center at Advanced Institute of Convergence Technology, SNU
- Non-contact AFM with Self-Optimizing and Pinpoint Scan Control for Quantitative Nano-Metrology
CONFERENCE TOPICS:
Application:
- • Polymers and Composites
- • Nanoelectronics, photonic and photovoltaic applications
- • Nanomaterials and Life Science
Method:
- • Nanomechanical and Electrical Characterization
- • Soft Material Characterization in Liquid Environment
- • Advanced Imaging
Lecture Sessions:
- • Organic Interfaces and Semiconductors
- • Photovoltaic technologies
- • Life Science and Biotechnology
- • New Frontiers in SPM Methodology
- • Special Session:*
Characterization of novel semiconducting materials with scanning probe microscopies
Hands-on-Session:
- • Kelvin probe force microscopy
- • Nanomechanical imaging (PinPoint) / Non-contact Mode
- • Liquid environment
- • Advanced PFM
*As a flagship research of UNIBO and CNR in Bologna, a special session will be dedicated to the characterization of novel semiconducting materials with multimodal scanning probe microscopies. It will highlight how scanning probe microscopies are fundamental to investigate such materials at the nanoscale and to untangle their diverse electronic, mechanical and chemical properties in multimodal imaging experiments.
Publications:
- • Direct Electrical Neurostimulation with Organic Pigment Photocapacitors.
- • Nanoparticle gated semiconducting polymer for a new generation of electrochemical sensors.
- • Transport properties of Si based nanocrystalline films investigated by c-AFM.
- • Electrically Controlled “Sponge Effect” of PEDOT:PSS Governs Membrane Potential and Cellular Growth.
- • Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy.
IMPORTANT DEADLINES:
Registration: September 1, 2019
Early Bird Registration (35% discount): May 20, 2019
Abstract Submission Deadline: July 20, 2019
Conference Organisation / Contact:
Justyna Sliwa (Park Systems)
nsfe@parksystems.com
Local Organizing Committee:
Tobias Cramer (DIFA, UNIBO)
Beatrice Fraboni (DIFA, UNIBO)
Daniela Cavalcoli (DIFA, UNIBO)
Cristiano Albonetti (ISMN, CNR)
Stefania Rapino (CIAMICIAN, UNIBO)
Conference Venue:
Piazza San Giovanni in Monte 2
40124 - Bologna
ACCOMODATION
Recommended hotels:
- Hotel Roma
- Hotel Internationale
- Zanhotel Tre Vecchi
For booking please click here
Image Contest*
Image Submission
Please send your outstanding AFM image** to nsfe@parksystems.com
Please include:
-Image Caption
-Scanning Conditions: System / Scan Size / Scan Mode / Scan Rate / Cantilever /Pixel
*To be able to take part in the image contest we kindly ask you to register to the conference. Every submitted image will be included and presented in the image contest during the conference. The best image will be awarded with a prize and a certificate.
** JPG/PNG/PDF format
Impressions from NSFE 2018 / 10-12 October, 2018, TU Bergakademie Freiberg
For the details and program of last year NSFE click here:
https://www.parksystems.com/nsfe2018
