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Advances in Atomic Force Microscopy: Nanomechanical Characterization by using PinPoint™ AFM

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Advances in Atomic Force Microscopy:

Nanomechanical Characterization by using PinPoint™ AFM
AFM Workshop
 

 When:

  • 21-22 March, 2019 / Iasi, Romania

 

Where:

  • “Alexandru Ioan Cuza” University, Iasi, Faculty of Physics-Department of Plasma Advanced Research Center (IPARC), 1st floor, Building A

 

20181022 workshop2

NX10 AFM

 Program

Thursday, March 21

  • 10:00 Welcome
  • 10:15 Introduction
  • 10:30 Talk: “Advances in Atomic Force Microscopy: Nanomechanical Characterization by using PinPoint™ AFM”/ Victor Bergmann, Application Scientist, Park Systems Europe
  • 11:15 Introduction to NX10 AFM /Live Demonstration on site (design and technical advantages, AFM scanners, How to change the tip on Park AFMs, etc.) / Claudia Moldovan, Schaefer Romania
  • 11:30 - 13:00 Live Measurements
  • 13:00 Lunch
  • 14:15 - 16:00 Live Measurements

 

Thursday, March 21

  • 10:00 - 13:00 Live Measurements

The End

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