|Contact Us  Global



Park Systems and University of Bologna are proud to announce the 2nd NanoScientific Forum Europe 2019 (NSFE 2019) on September 11 – 13, 2019.

After the successful first edition in October 2018 at the TU Freiberg, Germany we are happy to invite scientists and researchers working in the field of Atomic Force Microscopy to beautiful Bologna. The NSFE 2019 will be hosted by Tobias Cramer, Department of Physics and Astronomy of University of Bologna (UNIBO), and co-organized by CNR-ISMN Bologna, Italy.

This open AFM User Forum focuses on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM). With the NanoScinetific Concept - the idea behind the series of annual NSFE meetings - we are committed to:

  • • Bringing together science and the technology behind it,
  • • Bringing together AFM applications and methodology,
  • • Creating a platform for AFM users around Europe.


NSFE is hosted every year at a different prestigious scientific venue, under the patronage of Park Systems and NanoScientific Magazine



Prof. Ricardo Garcia
Instituto de Ciencia de Materiales de Madrid, CSIC, Spain

Dr. Rüdiger Berger
Max Planck Institute for Polymer Research, Germany

Dr. Akash Bhatnagar
MLU - Centre for Innovation Competence SiLi-nano, Germany

Dr.Miguel A. Galindo
CIC, University of Granada, Spain

Ass. Prof. Kim McKelvey
Trinity College Dublin, Ireland

Dr. Tobias Cramer
University of Bologna, Italy

Prof. Dr. Lukas Eng, Technical
University Dresden, Germany

Dr. Esther Barrena
CSIC • Institut de Ciència de Materials de Barcelona, Spain

Prof. Malgorzata Lekka
Institute of Nuclear Physics, Poland

Dr. Sang-Joon Cho
VP of Park Systems and Director of R&D Center at Advanced Institute of Convergence Technology, SNU



  • • Polymers and Composites
  • • Nanoelectronics, photonic and photovoltaic applications
  • • Nanomaterials and Life Science
  • • Special Session:
    Multimodal SPM and Characterization of Novel Semiconducting Materials


  • • Nanomechanical and Electrical Characterization
  • • Soft Material Characterization in Liquid Environment
  • • Advanced Imaging


*As a flagship research of UNIBO and CNR in Bologna, a special session will be dedicated to the characterization of novel semiconducting materials with multimodal scanning probe microscopies. It will highlight how scanning probe microscopies are fundamental to investigate such materials at the nanoscale and to untangle their diverse electronic, mechanical and chemical properties in multimodal imaging experiments.



An exciting agenda is planned for the 2.5 days:

  • • Lectures by renowned AFM researchers
  • • Instrument workshops on Park Systems AFMs, including basic and advanced measuring techniques as well as tips and tricks, how to obtain stunning AFM data
  • • Poster session and image contest with amazing prizes!
  • • Evening Program


Conference Organisation / Contact:

Justyna Sliwa (Park Systems)
This email address is being protected from spambots. You need JavaScript enabled to view it.

Local Organizing Committee:

Tobias Cramer (DIFA, UNIBO)
Beatrice Fraboni (DIFA, UNIBO)
Daniela Cavalcoli (DIFA, UNIBO)
Cristiano Albonetti (ISMN, CNR)
Stefania Rapino (CIAMICIAN, UNIBO)

Conference Venue:

Aula Giorgio Prodi


Piazza San Giovanni in Monte 2
40124 - Bologna


Recommended hotels:

- Hotel Roma
- Hotel Internationale
- Zanhotel Tre Vecchi

Please send an email to This email address is being protected from spambots. You need JavaScript enabled to view it. with a booking request for the selected Hotel. Please provide the conference code NSFE2019 to get a special prize rate.

Please fill in the registration form and your choice for hands-on-sessions. The invoice will be sent to you via email.
Conference fee:
Students / PhDs: 80eur
PostDocs/Professors/ Industry : 130 eur


Image Contest*

Image Submission
Please send your outstanding AFM image** to This email address is being protected from spambots. You need JavaScript enabled to view it.

Please include:
-Image Caption
-Scanning Conditions: System / Scan Size / Scan Mode / Scan Rate / Cantilever /Pixel 


*To be able to take part in the image contest we kindly ask you to register to the conference. Every submitted image will be included and presented in the image contest during the conference. The best image will be awarded with a prize and a certificate.

** JPG/PNG/PDF format

Impressions from NSFE 2018 / 10-12 October, 2018, TU Bergakademie Freiberg

Impressions NSFE 1
NSFE2018 group photo 11

For the details and program of last year NSFE click here:

NanoScientific Europe