Park Systems is proud to announce that it will be attending the IPFA 2017 being held from July 5-7.

The 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017) is focusing on failure analysis and will be held at the Ritz Carlton Chengdu, China.

More than 200 attendees and 40 exhibitors from all over the world are expected to participate in this event.

Join us at IPFA to learn more about our atomic force microscopy solutions for your research and industry application needs.

• Event Dates : July 5 – 7, 2017
  
• Venue : The Ritz Carlton Chengdo, China
  
• Park’s booth : 32
  

About IPFA:

The 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits ( IPFA 2017 ) is organized by the IEEE Reliability / CPMT / ED Singapore Chapter, IEEE Electron Devices Society Chengdu Chapter and the University of Electronic Science and Technology of China ( UESTC ) . The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.

IPFA 2017 will be devoted to the fundamental understanding of the physical mechanisms governing failure in a large variety of advanced semiconductor devices and the electrical - physical failure analysis techniques, methodologies and tools that could be use to reliably identify the root cause of failure in these devices.

Link :http://www.ipfa2017.com/