Park Systems, cordially invites you to visit our booth (#416) at 2013 ACS Spring Meeting in New Orleans, LA (April 7th ~ 11th). The exhibition will provide an excellent opportunity to learn about Park NX10, the most accurate research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. Park NX10 is built on Park's 28 years of technology leadership in AFM data accuracy, and its reputation as the leading nanotechnology solutions partner to research and industry.
- Products & Solutions
- AFM for Research and Surface Analysis
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- AFM for In-line Metrology
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Surface Inspection Metrology
- Ellipsometry Accessories
- Applications
- Services
- Events
- Company
- Learning Center
- NANOacademy
- Lectures
- How AFM Works
- Expert Corner
- Analyze Cells
- Programs
- Park AFM Scholarship
- Products & Solutions
- AFM for Research and Surface Analysis
- AFM for In-line Metrology
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- Applications
- Services
- Events
- Company
- Investors
- Learning Center
- NANOacademy
- Programs
- Resources
- You are here:
- Home
- Events
- Meetings & Exhibits
- Exhibitions
- ACS Spring Meeting 2...
Copyright © 2024 Park Systems. All Rights Reserved.