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Park Systems, the leading nanotechnology solutions partner of nanoscale measurements, will exhibit at 2013 MRS Spring Meeting in San Francisco, CA (April 1st ~ 5th). Please come and visit us at Booth#418 to learn more about the latest AFM technologies at Park. The exhibition will provide an excellent opportunity to learn about Park NX10, the most accurate research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. Park NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers.