Park Systems, the leading atomic force microscope (AFM) and nano-metrology solutions partner for the most accurate AFM results, cordially invites you to our booth (#B-705) at the 2012 JASIS (Japan Analytical Scientific Instruments Show). In harmony with the theme “Discover the Future,” Park would like to present the NX10, industry’s only True Non-Contact AFM with industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. Park NX10 is the world’s premium research grade AFM that is user-friendly and convenient to use for new and experienced users alike. The NX platform builds on Park’s 28 years of technology leadership in AFM data accuracy, and its reputation as the leading nanotechnology solutions partner to research and industry.

http://www.jasis.jp/2012/english/index.html