Park Systems, the leading nanotechnology solutions partner of nanoscale measurements, will exhibit at the Diskcon USA 2011 in Santa Clara, USA, October 19^th to 20^th. Please come and visit us at Booth 201 to learn our industrial product line. Park Systems will be featuring a wide range of industrial AFM products for all aspects of disk characterization, from automatic defect review to undercut and sidewall measurement. Learn about the XE-HDM, our automated industrial XE-series AFM, specially designed for hard disk media and substrate applications. With newly developed features designed for user convenience and safety, the XE-HDM combines the superb performance of the XE-series AFM with the high-throughput capability required by hard disk media manufacturers. Also, discover the XE-3DM, Park Systems’ new 3D AFM, utilizing True Non-Contact mode for the non-destructive sidewall roughness measurement of soft photoresist structures. With its unique tilt head capability, the XE-3DM is a breakthrough in high resolution 3D AFM measurements.

http://www.idema.org/?p=2054