The 30st European Symposium on Reliability of Electron Device, Failure Physics and Analysis (ESREF) will take place on September 23-26, 2019 in Toulouse, France. Park Systems is proud to announce its participation as an exhibitor!
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
Join the team of Park Systems at their booth #24 on September 24 at 10:50 for a flash presentation to talk about the AFMs that impact science! Discuss with us innovative AFM application solutions for material sciences, in particular for investigating electrical and nanomechanical properties of materials at the nanoscale.
Come and join our scientific talk "Why High Vacuum? High Sensitivity and High Repeatability Measurements" on September, 24 at 10:50. Presenter: Matthew Lefevre.
- Time: 23 – 26 September 2019
- Venue: Centre des Congrès Pierre Baudis, Toulouse, France
- Our location: Park Systems booth #24