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Welcome to Park Q3, 2012 Newsletter


Featured Application Featured Product News and Events  Upcoming Exhibitions  Park Research Interview Series Accurate Image from Park AFM   





Featured Application

Automatic Defect Review (ADR)

Figure 1. 
Using the defect location map provided from a CandelaTM tool, the ADR automatically goes to the defect location and images the defects in two steps; a larger, survey scan image to refine the location and then a smaller, zoom-in scan image to obtain the details of the defect.

Park's Automatic Defect Review (ADR) for media and substrates provides 800% gain in throughput compared to current manual methods to locate the and image defects. With automated reference marker detection, stage mapping, transfer of Candela defect maps, survey & zoom-in imaging, and profiling of imaged defect types, Park ADR allows automated defect identification and analysis with a success rate of over 95%. Also, Park’s True Non-contact Mode increases tip life significantly, and with a single tip, one full run of ADR  can detect and image over 500s of defects.  

Click here for further information on the application of ADR (Available in PDF format Download)

Featured Product

201209-q3-s1-xe-hdmXE-HDM: Automatic Defect Review AFM for Hard Disk Media and Substrates

For researchers working with hard disk media and other flat substrates, the process of identifying nanoscale defects is time consuming with conventional tools, hindering throughput. Park XE-HDM is an automatic defect review AFM that speeds and improves the way defects in HDD substrates and media are identified, scanned, and analyzed. The XE-HDM significantly increases throughput for the defect review process when compared with more traditional methods of defect review. Park’s True Non-Contact Mode allows significantly longer tip life for general purposes and defect imaging; tests on defect imaging demonstrated a 10x increase in tip life.

Click here for the detailed product information.



News and Events

Free Park AFM Webinar - 1. NX10: The World's Most Accurate AFM / 2. Automatic Defect Review

Please join us for two interactive webinar sessions to learn more about the latest AFM technologies at Park. The webinar will cover two topics as below. 

Part 1. NX10: The World's Most Accurate AFM 
Part 2. Automatic Defect Review (Asia, Europe Only)

The first session will walk you through the benefits of Park NX10, talk to you about our  nano technology solutions for your application needs, and show you a short overview of technology behind Park NX10. The second session will cover the technology of automatic defect review (ADR).  Do not miss this opportunity to meet the technical experts from Park who will talk during these webinar sessions.  At the end of each session, you will have an opportunity to ask any questions you may have.

Register for a session now by clicking a date below

Tuesday, October 9 
China 1:00 PM - 1:30 PM (CST)
Japan 4:00 PM - 4:30 PM (JST)
Americas 4:00 PM - 4:30 PM (EST)

Wednesday, October 10 
Asia 11:30 AM - 12:30 PM (IST)
Europe 1:00 PM - 2:00 PM (GMT)

*Once registered you will receive an email confirming your registration with information you need to join the Webinar.
Click here for the full events article.

Park Systems Has been Awarded from the Minister of Knowledge and Economy at NanoKorea 2012.

Suwon, South Korea, August 16, 2012– Park Systems today announced that the Korean Ministry of Knowledge and Economy awarded the Park NX10, the world’s most accurate atomic force microscope, as a NanoKorea 2012 most innovative product. The NX10 builds on Park’s 29 years of experience and technical leadership in atomic force microscopes, and solidifies Park’s reputation as a leading nanotechnology solutions partner to research and industry.

The demonstration of accuracy with the NX10 especially impressed the panel from the Ministry of Knowledge and Economy. They recognized that in nanoscale metrology (measurement), accurate repeatable, reproducible and reliable data is just as important as the resolution of the microscope. At the heart of Park’s innovative design for the NX10 is a crosstalk elimination (XE) platform that ushers in a new era of nanometrology through overcoming the errors introduced by non-linearity and non-orthogonality of systems driven by conventional piezotube scanning.
Click here for the full events article.

Park Systems Hosts the 3rd India-Korea Joint Workshop Participants at Its Global Headquarters.

Suwon, South Korea, August 17, 2012 - Members of the 3rd India-Korea Joint Workshop on Scientific Research visited Park Systems’ global headquarters for a tour of the facilities and demonstration of the latest atomic force microscope (AFM) solutions from Park.

During the tour, more than fifteen leading professors and researchers from India and Korea learned about Park's accurate AFM solutions. The visitors were shown Park’s technical advances in Crosstalk Elimination, True Non-Contact Mode (where the AFM probe operates in a zone of attractive atomic force but never touches the sample), the higher scanning speed of the Z-servo, XYZ scanner linearity, closed-loop detector noise and minimized thermal drift. Park scientists also provided hands-on demonstrations of the NX10, the world’s most accurate atomic force microscope, and XE-Bio, a powerful 3-in-1 nanoscience research tool with a unique combination of Ion Conductance Microscopy (ICM) and True Non-Contact Mode AFM.
here for the full events article.

Upcoming Exhibitions

The Biophysical Society of Japan 2012, September 22~24, 2012, Nagoya, Japan

MRS Fall 2012Novemeber 26~30, 2012, Boston, USA - (Booth #416)

Semicon Japan 2012December 05~07, 2012, Tokyo, Japan  - (Booth #5A-203)

Park Research Interview Series


Interview with Professor Noemi Rozlosnik, Technical University of Denmark  (Park XE-Bio user)
Study of Polymer Based Biosensor for Rapid Electrochemical Detection of Virus Infection of Human Cells using Park XE-Bio's Scanning Ion Conductance Microscopy (SICM)

"I have used many different AFMs, but always preferred the True Non-Contact method of Park AFM. The True Non-Contact method gives better results especially in soft samples. I got a couple of nice results with a very high resolution. I have been in contact with the company for many, many years, and I never had any problem with support, which is very good. If I had any problem with the instrument, I’ve got help very fast. I’m fully satisfied with Park Systems."

Accurate Image from Park AFM

HDD Automatic Defects Review (ADR)

201209-q3-s2The following data, consisting of 466 images of defects found on a single media substrate sample, was acquired by Park XE-HDM with a single tip. Increased productivity in throughput was 800% vs. the previous manual methods.

Number of Defects Coordinate Provided by Optical Insepction Tool = 484
Number of Defects Found by ADR = 466
Success rate = 96.3%


Click here to see more accurate images from Park AFMs


For further inquiries please contact us via This email address is being protected from spambots. You need JavaScript enabled to view it.

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