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7, Aug 14'
Press-Release
Park Systems XE7-CR "Park AFM meets our rigid requirements for accurate measurements at the highest nanoscale resolution at a price we can afford."Dr. Gwo-Ching Wang, Pr...
15, Jul 14'
Press-Release
Park NX Wafer Atomic Force Mircroscope "Park NX Wafer, bare wafer ADR is the most advanced, fully automated defect review solution available -designed for leaders in Se...
15, Jul 14'
Press-Release
   The cover image shows the world’s first observation of rat tracheal tissue in an aqueous environment. The luminal surface of the trachea tissue was succes...
28, May 14'
Press-Release
Park NX-PTR AFM Nanometrology Pole Tip Recession (PTR) measurements for inline HDD slider "Park Systems trademark AFM line demonstrates the accuracy and reliabilit...
18
May 2014'
Newsletters
    Q2 2014         EVENTS 2014 International Conference on Nanoscience ...
22, Apr 14'
Press-Release
Dr. Sang-il Park, CEO & Founder Park Systems “We have become the leader in nanotechnology design by constantly outperforming our competition, and creating ways t...
20
Apr 2014'
Newsletters
Park Systems Inc Newsletter - Q2, 2014 Contents • Message from President• Spotlight on Employee• Park Systems CEO Dr. Sang-il Park Presenter at M...

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