How to choose an AFM probe
Nanolithography
For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.
| Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote | ||||||||||||||||||||||||||||||||||||
| DT-NCHR | 80 | 400 | Nanosensors | ▪ Cantilever with high force constant for Lithography, Backside reflex coating ▪ Diamond-coated tip |
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NANOSENSORS™ DT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
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| ElectriMulti75-G | 3 | 75 | Budget Sensors | ▪ Cantilever for electrical modes(EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Conductive tip for electrical application, coated with Cr-Pt |
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Rotated Monolithic silicon probe
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| CDT-CONTR | 0.5 | 20 | Nanosensors | ▪ Contact contact cantilever for Lithography based on oxidation, Backside reflex coating ▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip carrier |
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NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
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| CDT-NCHR | 80 | 400 | Nanosensors | ▪ Cantilever with high resonant frequency for Lithography, Backside reflex coating ▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip carrier |
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NANOSENSORS™ CDT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
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| 25Pt300B | 18 | 14 | - | ▪ Contact cantilever made of solid platinum ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
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The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.
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