The leading innovator of nanoscale
microscopy and metrology solutions

Accelerate Your Research

Park FX40

Accurion i4

The ultimate stability and accuracy
solution for your scientific research

Park NX20

Accurate Large Sample AFM solution
for research and failure analysis

Park NX-Mask

Repair your most challenging
photomask defects

Park NX-Wafer

Industry's leading automated AFM
for in-line metrology solutions

Emerging Trends of Nanotechnology

Applications

Read the Park systems' Technical Articles about AFM to understand recent developments

Online NanoAcademy

AFM Experts provides you Online Courses, Webinar, Live Demos and Educational Videos from AFM Experts

Scholarship

Park Systems aims to support the next generation of Trail Blazers in Nanoscience by encouraging young researchers to share and discuss their research

2017 IISc Workshop invitation and agenda

AFM Workshop will be held in Bangalore, India on 20-21, July, 2017 in collaboration with Park Systems and ICON Analytical Equipment Pvt. Ltd.

The workshop will cover topics such as Advantage of Park Technology and latest development and Scanning Ion Conductance Microscopy for Live Cell Research from Park Systems.

In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 & NX-Bio System—a tool designed to enable innovative studies in advanced research. The entire event is open to all interested parties and includes lunch.

Event Dates : July 20th, 2017(9:45am to 5:00pm) / July 21st, 2017(9:45am to 1:00pm)
Venue : Seminar Hall, 3rd Floor, Bio Engineering Department, Indian Institute of Science, Bangalore

Latest Park News

Park Systems Continues Its Reign as Market Leader in Atomic Force Microscopy

Press-Release | 20 March 2024

Sang-il Park, CEO of Park Systems, Honored with the Esteemed Hanyang Paiknam Prize

Press-Release | 17 October 2023

Park Systems Celebrates Groundbreaking Expansion to Gwacheon and Yongin

Press-Release | 19 September 2023

Explore Park Products

Park
FX40

A New Class of Atomic Force Microscope

Park
NX-Mask

Repair your most challenging photomask defects

Accurion
EP4

Thin film characterization imaging ellipsometer nanofilm

Accurion
i4

Compact benchtop isolation table in 3 sizes for versatile use

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The leading innovator of nanoscalemicroscopy and metrology solutions