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The leading innovator of nanoscale
microscopy and metrology solutions

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FX40-AFM

Accelerate Your Research

Park FX40
NX-Wafer-AFM

Accurion i4

The ultimate stability and accuracy
solution for your scientific research

NX20-AFM

Park NX20

Accurate Large Sample AFM solution
for research and failure analysis

NX-Mask-AFM

Park NX-Mask

Repair your most challenging
photomask defects

NX-Wafer-AFM

Park NX-Wafer

Industry's leading automated AFM
for in-line metrology solutions

Emerging Trends of Nanotechnology

Read the Park systems' Technical Articles about AFM to understand recent developments

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AFM Experts provides you Online Courses, Webinar, Live Demos and Educational Videos from AFM Experts

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Park Systems aims to support the next generation of Trail Blazers in Nanoscience by encouraging young researchers to share and discuss their research

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Join Park Systems at their stand in the Welcome Area of ESREF, Bordeaux, France.

ESREF is an International Symposium on Reliability of Electron Devices, Failure Physics, and Analysis with the focus on reliability assessment of embedded systems in harsh environments required by automotive, avionics and space applications. Don’t miss our technical talk on the latest technological development for industrial applications on Tuesday, September 26.

  • Event Dates : September 25-28, 2017
  • Venue : Bordeaux, France

Link: https://esref2017.sciencesconf.org/

 

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Explore Park Products


A New Class of Atomic Force Microscope

Park FX40

Repair your most challenging photomask defects

NX-Mask

Thin film characterization imaging ellipsometer nanofilm

Accurion EP4

Compact benchtop isolation table in 3 sizes for versatile use

Accurion EP4

Experience our product's high-quality, precise, and long life backed by our worldwide service network. We are strongly committed to maintaining the quality of our products, making us a trustworthy choice for all your repair and maintenance needs.

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