Park Systems is proud to announce that it will be attending the International Symposium for Testing and Failure Analysis (ISTFA)’s 2017 event being held from November 5-9! Come meet our staff at Pasadena Convention Center in Pasadena, CA when the event’s exhibition space opens on November 7-8.
Organized by the Electronic Device Failure Analysis Society (EDFAS), an ASM International Affiliate Society, ISTFA has become a premier event for engineers and other members of the failure analysis community to explore the latest research and tools available to facilitate their work.
- Event Dates : November 5 – 9, 2016 (Exhibit: November 7 – 8)
- Venue : Pasadena Convention Center — Pasadena, CA
- Park’s booth : 321
About EDFAS:
Failure analysis is a critical element of the electronics industry. However, it's also a diverse combination of electronics and materials analysis. Because no existing society was suited to meet the specific needs of our technical community, scientists and engineers who perform failure analysis on electronic devices have never enjoyed representation in terms of a dedicated, focused society.
In 1998, considerable effort by the Steering Committee of the International Symposium for Testing and Failure Analysis (ISTFA) resulted in a recommendation to the ASM Board of Trustees: that a new ASM Affiliate Society be chartered to serve the specific needs of the electronic device failure analysis community. Hence, the ASM Electronic Device Failure Analysis Society, or EDFAS, was formed.
