The Microscience Microscopy Congress 2019, the biggest microscopy event in United Kingdom taking place from 1 to 4 July 2019 in Manchester (UK), establishes a forum for research and technology from micro- to nanotechnology with 36 conference sessions, an exhibition with more than 90 companies represented, a great selection of features such as pre-event workshops and turn-up-and-learn training opportunities and a busy social program.
Park Systems and its UK partner, CN Technical Services Limited, are proud to be a part of this event with a booth and satellite event on site!
- Event Dates: 1-14 July, 2019
- Venue: Manchester Central, Petersfield, Manchester, M2 3GX, UK
- Our location: CN Tech booth #441
Join Park’s Commercial AFM Workshop on "Advances in Atomic Force Microscopy: PinPoint Piezo Force Microscope – frictionless imaging technique"
Date:Tuesday, July 2, 11:30
ABSTRACT:
Electromechanical coupling in materials is a key property that provides functionality to a variety of applications including: sensors, actuators, IR detectors, energy harvesting, and biology. Most materials exhibit electromechanical coupling in nanometer-sized domains. Therefore, to understand the relationships between structure and function of these materials, characterization on the nanoscale is required. This electromechanical coupling property can be directly measured in a non-destructive manner using piezoelectric force microscopy (PFM), a well – established method in atomic force microscopy (AFM). The conventional PFM is usually performed in contact mode. Contact mode, however, has challenges for a great variety of samples, e.g. the characterization of an annealed phenanthrene thin film on top of an ITO surface. The main difficulty in imaging these samples is due to the phenanthrene thin film forming rod-shaped nanostructures that are very susceptible to displacement by a scanning AFM probe. This is the reason for the newly developed PinPointTM PFM mode by Park Systems. As opposed to standard contact mode, in PinPointTM mode the AFM probe monitors its feedback signal, approaches towards the sample surface until a predefined force threshold is reached, and measures the Z scanner’s height. The AFM probe is then rapidly retracted away from the surface to a user-defined height. During the data acquisition the XY scanner stops movement completely and therefore no AFM probe movement takes place on the sample surface at any time. This allows for a more accurate representation of the surface as the nanorods are not moved from their original position.
Link: More information here.