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FX40-AFM

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Repair your most challenging
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Industry's leading automated AFM
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AFM Probe Selection Guide
How to choose an AFM probe
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EFM/DC-EFM/KPFM

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-CONTSCPt 0.2 25 Nanosensors ▪ Cantilever for DC-EFM/PFM/C-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5		 Request for Quote
Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 25 1 - 57
NSC36/Cr-Au 1
2
0.6		 90
130
65		  Mikromasch ▪ Cantilever for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ 3 cantilevers on a chip		  Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
NSC14/Cr-Au 5 160 Mikromasch ▪ Cantilever for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au		 Request for Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1
PPP-NCSTAu 7.4 160 Nanosensors ▪ Cantilever for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Au		 Request for Quote
Property Nominal Value Specified Range
Thickness /µm 2.8 1.8 - 3.8
Mean Width /µm 27 19.5 - 34.5
Length /µm 150 140 - 160
Force Constant /(N/m) 7.4 1.2 - 29
Resonance Frequency /kHz 160 75 - 265
PPP-EFM 2.8 75 Nanosensors ▪ Cantilever for DC-EFM/PFM/SCM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5		 Request for Quote

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
NSC36/Pt 1
2
0.6		 90
130
65		 MikroMasch ▪ Cantilever for DC-EFM/PFM
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt		 Request for Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
Cantilever A 30 90 160 0.1 1 4.6 110 32.5 1.0
Cantilever B 45 130 240 0.2 2 9 90 32.5 1.0
Cantilever C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
ElectriMulti75-G 3 75  Budget Sensors ▪ Cantilever for electrical modes(EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Conductive tip for electrical application, coated with Cr-Pt		 Request for Quote

Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

  value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
SPARK 70 Pt 2 70 ▪ Probe for KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm		 Request for Quote
SPARK 150 Pt 18 150 ▪ Probe for KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm		 Request for Quote
SPARK 350 Pt 42 350 ▪ Probe for KPFM/PFM
▪ Backside reflective coating (Ti-Pt)
▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt)
▪ Typical tip length: 5 - 8 μm
▪ Typical tip radius: ~18 nm		 Request for Quote

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