The 34th edition of The Surface & Interface Days (JSI 2020) will take place on 22 to 24 January 2020 at the Pierre and Marie Curie campus of Sorbonne University, France.
Park Systems France is honored to contribute to the event with a booth and practical hands-on-sessions on Park NX20 large sample AFM!
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Get hands on the newest generation of Atomic Force Microscopy (AFM) and sign up for a hands-on-session slot on Park Systems NX20 large sample AFM. Learn about the latest updates in materials’ nanocharacterization with wide range of nanomechanical, magnetic and electrical measuring modes, such as Scanning Spreading Resistance Microscopy SSRM, conductive AFM (C-AFM) and Scanning Capacitance Microscopy (SCM).
- Event Dates: January 22 – January 24
- Venue: Pierre and Marie Curie campus of Sorbonne University, Paris
- Our location: Park Systems
Sign up here: www.parksystems.com/JSI2020
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On the top of that, Park Systems will be presenting the advantages of high vacuum for the electrical AFM during the poster session. Join our application specialist, Matthew Lefevre, for the poster discussion “Better in Vacuum.”
To acknowledge the best poster during the JSI Park Systems is delighted to sponsor the Best Poster Award.
