-
Sic OpticalModulator KelvinProbeForceMicroscopy SetpointMode dielectric_trench Tungsten_disulfide MESA structure Global_Comm Trench BaTiO3 Filter Electical&Electronics Conductive AFM IISCBangalore Patterns Steps LiquidImaging NUS_NNI_Nanocore HfO2 Bacterium Deposition SSRM Polyurethane TipBiasMode ScanningThermalMicroscopy Corrosion MLCC fe_nd_b Leakage Calcium Biofilm Collagen NCM\ PolymerBlend SPMLabs
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Block copolymer ; Fast scan
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm
- Scan Rate: 6Hz, 13Hz
- Pixel: 256×256
- Scan Mode: Tapping
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm
- Scan Rate: 6Hz, 13Hz
- Pixel: 256×256