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MagneticPhase kelvin probe force microscopy Dr.JurekSadowski Yeditepe_University TiO2 ContactMode LateralForceMicroscopy Bismuth F14H20 HiVacuum TappingMode PECurve Dopped chemical_compound Formamidinium_lead_iodide PetruPoni_Institute oxide_layer SiliconCrystal HexagonalBN Permalloy alkanes Lateral ito_film Nickel Vacuum Polyvinylidene_fluoride VinylAlcohol Insulator Polyethylene Thermal MagneticForceMicroscopy Ca10(PO4)6(OH)2 Ni81Fe19 high_resolution NTU
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Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512