-
Glass Electrode Aggregated_molecules Al2O3 TransitionMetal Memory PolycrystallineFerroelectricBCZT temperature controller AFM silicon_oxide Solution Vac Formamidinium_lead_iodide AM_KPFM Trench Galfenol PinPointMode block_copolymer IIT-chennai KelvinProbeForceMicroscopy Ca10(PO4)6(OH)2 Phosphide rubber HydroGel STM Praseodymium MfmAmplitude Ptfe Zhi Bio PVAC MfmPhase HiVacuum membrane Conductivity ScanningSpreadingResistanceMicroscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
NiFe
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm