-
Conductive AFM Phosphide Current Ceramics Mfm graphene_hybrid Vinylpyridine Polyvinylidene_fluoride single_layer LateralForceMicroscopy Indent Ceramic pulsed_laser_deposition Fujian Adhesive IRDetector PetruPoni OxideLayer SiliconeOxide Magnets Temasek_Lab hard_disk_media AM_KPFM LiBattery PhaseChange ring shape silicon_oxide Wildtype FM_SKPM Carbon IMT_Bucharest ForceVolumeImage Dimethicone Epoxy high_resolution
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Si nanowire on glass
Scanning Conditions
- System: XE7
- Scan Mode: SThM
- Cantilever: Thermal probe (k=0.25N/m)
- Scan Size: 3.5μm×3.5μm
- Scan Rate: 1Hz
- Pixel: 512×256
- Scan Mode: SThM
- Cantilever: Thermal probe (k=0.25N/m)
- Scan Size: 3.5μm×3.5μm
- Scan Rate: 1Hz
- Pixel: 512×256