-
DLaTGS BTO Iron Reduction IISCBangalore PetruPoni KAIST OpticalModulator Floppy Nanostructure Laser Optoelectronic Oxidation Lateral CHRYSALIS_INC 2-vinylpyridine India PUR Ram Polyurethane SurfaceChange ULCA VerticalPFM SingleLayer Roughness Mosfet NiFe HighAspect mono_layer Ferroelectric AIN 2dMaterials NeodymiumMagnets polyvinyl acetate neodymium_magnets
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Cutting Graphene
Scanning Conditions
- System : FX40
- Scan Mode: Contact after lithography
- Scan Rate : 0.7 Hz
- Scan Size : 30μm×30μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)
- Lithography condition : Force 500 nN, writing speed 0.1μm/s, AC bias 10 V @ 40kHz