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LiquidCrystal CHRYSALIS_INC TipBiasMode Foil Semiconductor Nickel DataStorage Vac ForceDistanceSpectroscopy atomic_layer SiliconCrystal HanyangUniv NCM block_copolymer Glass ThermalProperties Change atomic_steps Molybdenum Hexylthiophene PS_LDPE ferromagnetic Pvdf Edwin Praseodymium ito_film thermal_property ScanningSpreadingResistanceMicroscopy OpticalWaveguide BiVO4 PhaseChange Ram self-assembly Multiferroic_materials molecule
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TSV Cu pad oxidation
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)