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vertical_PFM Glass Stiffness Conductive AFM Global_Comm HumanHair Bmp SiWafer Filter LeakageCurrent Optoelectronic SRAM semifluorinated_alkane Electical&Electronics block_copolymer Hysteresys Silver DiffractiveOpticalElements Calcium Styrene Electrode self_assembly IRDetector ContactMode ChemicalCompound VerticalPFM Cobalt ThinFilm Conducting HBN Galfenol SiliconOxide SurfaceOxidation Defect Scratch
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Crosslinked starch & pectin fibers
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Tapping
- Scan Rate : 0.31 Hz
- Scan Size : 15μm×15μm
- Pixel Size : 256×256
- Cantilever : ContSCR (k=0.2N/m, f=25kHz)