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INSP Tin sulfide BiasMode PetruPoni_Institute GranadaUniv PtfeMembrane PDMS SiliconeOxide Layer bias_mode HardDiskMedia DeflectionOptics DataStorage plastic PatternedSapphireSubstrat Piranha TemperatureControllerStage KPFM mono_layer PinpointPFM TempControl SmallScan Ferroelectric FM_SKPM mechanical property PtfeFilter ULCA DiffractiveOpticalElements EvatecAG Praseodymium Litho solar_cell CuSubstrate FrictionalForceMicroscopy ForceVolumeMapping
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Patterned Sapphire Substrate (PSS)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256