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vertical_PFM CeramicCapacitor PhaseImaging DeflectionOptics BloodCell ElectroChemical Mechinical Vinylpyridine C_AFM IVSpectroscopy FM_SKPM temperature_control ThinFilm flakes ForceVolumeImage Copper ShenYang OpticalWaveguide MoirePattern MembraneFilter KPFM Silicon AnodizedAluminumOxide frequency_modulation Switching ScanningSpreadingResistanceMicroscopy Bacteria Polydimethylsiloxane SurfaceChange Anneal silicon_carbide Pattern Ni-FeAlloy CVD Magnetic Force Microscopy
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HOPG
Scanning Conditions
- System : FX40
- Scan Mode: Sideband, AM KPFM
- Scan Rate : 0.55 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 256×256
- Cantilever : NSC36 Cr-Au C (k=0.6N/m, f=65kHz)