-
Device Polystyrene PolycrystallineFerroelectricBCZT Patterns Chrome light_emission Bmp Lateral Perovskite Nickel TemperatureControl Beads Logo Ceramics ULCA ScanningThermalMicroscopy small_scan Yeditepe_University PtfeFilter Growing Moire SurfaceChange InsulatorFilm Hexylthiophene Hexatriacontane Change alkanes Au111 PvdfBead IVSpectroscopy ConductiveAFM INSP vertical_PFM Oxidation KPFM
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
2L-MoS₂ (1/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.25 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 4 Hz
- Scan Size : 2.5μm×2.5μm
- Pixel Size : 512×512
- Cantilever : ContSCPt (k=0.2N/m, f=25kHz)