-
plastics Layer KelvinProbeForceMicroscopy polyvinyl acetate rubber MagneticForceMicroscopy CuFoil Semiconductor Nanostructure Filter SoftSample atomic_layer Oxidation Metal MoirePattern MfmPhase Fet C36H74 Lift Polyaniline Steps food Boron PinpointPFM OxideLayer SAM SolarCell Calcium Worcester_Polytechnic_Institute Polyethylene BTO India lithography ConductiveAFM kelvin probe force microscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Mo film
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz, 0.8 Hz
- Scan Size : 5μm2, 15μm2
- Pixel Size : All 1024×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)